IEEE

Multi-Class Classification of Plant Leaf Diseases Using Feature Fusion of Deep Convolutional Neural Network and Local Binary Pattern

Abstract: Plant diseases are one of the primary causes of decreased agricultural production quality and quantity. With ongoing changes in plant structure and cultivation techniques, new diseases are ...
IEEE

Class Imbalance Wafer Defect Pattern Recognition Based on Shared-Database Decentralized Federated Learning Framework

Abstract: In this article, a novel shared-database decentralized federated learning (SDeceFL) framework is developed for wafer defect pattern recognition (DPR). Specifically, a differential privacy ...