A collaborative research team led by Prof. Ma Yanwei from the Institute of Electrical Engineering (IEE) of the Chinese ...
A new technical paper titled “The van der Waals Gap: a Hidden Showstopper in Semiconductor Device Scaling” was published by ...
Manufacturing organizations are confronted with clear choices: proactively transform operations or accept competitive decline ...
A new technical paper titled “Large-scale crossbar arrays based on three-terminal MoS2 memtransistors” was published by ...
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