This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
Representing the most recent generation of double-data-rate (DDR) SDRAM memory, DDR4 and low-power LPDDR4 together provide improvements in speed, density, and power over DDR3. However, such speed and ...
This paper briefly discusses the approaches for Validation Environment and Test methodologies adopted for 8-bit microcontroller family based products. We would be focusing on modularity and the need ...
Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...
Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital ICs. Delay testing uses TD (transition delay) patterns created by ATPG (automatic test ...
The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...
Dr. Stephen will cover the process of developing and manufacturing reliable Luminex biomarker assays, as well as using those assays to test samples. She will examine the development of Ampersand ...
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