Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Omron showcased advanced testing tools for compact electronics, featuring blade pins, relays, and more at DesignCon 2026.
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Electronics are getting more sophisticated and complex every day. Chips, boards, and the systems they comprise are increasingly difficult to design. Companies engaged in electronic product development ...
In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...
A product with the best technology might still fail if the user interface isn't easy to use and intuitive. You may have noticed the failure to consider one of the most important system components ...
Diagnostic test developers, including clinical laboratories, responded to the COVID-19 pandemic with inspiring creativity to meet patient testing needs. These developers found unique ways to enable ...
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