FPGA devices have grown to ASIC size and complexity, but traditional EDA tools and methodologies have failed to keep pace. Engineers designing high-end FPGAs are beginning to face the types of ...
Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...
FPGA devices have grown to ASIC size and complexity, but traditional EDA tools and methodologies have failed to keep pace. Engineers designing high-end FPGAs are beginning to face the types of ...
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