The huge undertaking of verifying a system-on-chip (SoC) design has challenged engineers for more than 20 years –– the amount of time spent on it hasn’t varied much from between 50-70% of the entire ...

The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...

When asked, many engineers will say that the goal of a test plan for a PCB is full or 100% test coverage. When pressed further, they usually admit that 100% test coverage is virtually impossible to ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

Advances in very deep-submicron process technology require corresponding investments in design and test. Design infrastructure enabling the achievements of advanced design capability is well ...