When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...

An explosion in design complexity, fueled by increased transistor density and fundamental shifts in chip architectures, are beginning to overwhelm traditional approaches to test. Defects can show up ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...

Manufacturers of aviation engine components are being impacted by Industry 4.0's emphasis on quality control. Industry 4.0 is challenging these manufacturers to rethink outdated QC processes and ...